Soft X-ray spectra by wavelength dispersive spectrometry as...

IEEE Transactions on Appiled Superconductivity 2003 / 06 Vol. 13; Iss. 2

Soft X-ray spectra by wavelength dispersive spectrometry as a micron scale tool to determine copper valence

Mller, K., Meen, J.K., Elthon, D.
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Volume:
13
Language:
english
Journal:
IEEE Transactions on Appiled Superconductivity
DOI:
10.1109/tasc.2003.812513
Date:
June, 2003
File:
PDF, 311 KB
english, 2003
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