[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - A fast and accurate per-cell dynamic IR-drop estimation method for at-speed scan test pattern validation
Yamato, Yuta, Yoneda, Tomokazu, Hatayama, Kazumi, Inoue, MichikoYear:
2012
Language:
english
DOI:
10.1109/test.2012.6401549
File:
PDF, 3.72 MB
english, 2012