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[IEEE 2005 International Semiconductor Device Research Symposium - Bethesda, Maryland, USA (Dec. 7-9, 2005)] 2005 International Semiconductor Device Research Symposium - Monitoring the Self-Heating in a High Frequency GaN HFET
McAlister, S.P., Bardwell, J.A., Haffouz, S., Tang, H.Year:
2005
Language:
english
DOI:
10.1109/isdrs.2005.1596077
File:
PDF, 222 KB
english, 2005