[IEEE CAS 2005 2005 International Semiconductor Conference,...

  • Main
  • [IEEE CAS 2005 2005 International...

[IEEE CAS 2005 2005 International Semiconductor Conference, 2005. - Sinaia, Romania (Oct. 3-5, 2005)] CAS 2005 Proceedings. 2005 International Semiconductor Conference, 2005. - The junction edge leakage current and the blocking I-V characteristics of commercial glass passivated thyristor devices

Obreja, V., Manea, E., Codreanu, C., Avram, M., Podaru, C.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
2
Year:
2005
Language:
english
DOI:
10.1109/smicnd.2005.1558823
File:
PDF, 2.21 MB
english, 2005
Conversion to is in progress
Conversion to is failed