Impact of Technology Scaling on SRAM Soft Error Rates

IEEE Transactions on Nuclear Science 2014 / 12 Vol. 61; Iss. 6

Impact of Technology Scaling on SRAM Soft Error Rates

Chatterjee, I., Narasimham, B., Mahatme, N. N., Bhuva, B. L., Reed, R. A., Schrimpf, R. D., Wang, J. K., Vedula, N., Bartz, B., Monzel, C.
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Volume:
61
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2014.2365546
Date:
December, 2014
File:
PDF, 1.30 MB
english, 2014
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