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[IEEE 22nd IEEE VLSI Test Symposium, 2004. - Napa Valley, CA, USA (25-29 April 2004)] 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - Boundary scan for 5-GHz RF pins using LC isolation networks
Tian-Wei Huang,, Pei-Si Wu,, Ren-Chieh Liu,, Jeng-Han Tsai,, Huei Wang,, Tzi-Dar Chiueh,Year:
2004
Language:
english
DOI:
10.1109/vtest.2004.1299263
File:
PDF, 1.40 MB
english, 2004