Characterization of structural defects in semipolar $\{...

Characterization of structural defects in semipolar $\{ 20\bar{2}1\} $ GaN layers grown on $\{ 22\bar{4}3\} $ patterned sapphire substrates

Yamane, Keisuke, Inagaki, Takashi, Hashimoto, Yasuhiro, Koyama, Masakazu, Okada, Narihito, Tadatomo, Kazuyuki
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
53
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.53.035502
Date:
March, 2014
File:
PDF, 1002 KB
english, 2014
Conversion to is in progress
Conversion to is failed