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[IEEE 2005 International Conference On Simulation of Semiconductor Processes and Devices - Tokyo, Japan (2005.09.3-2005.09.3)] 2005 International Conference On Simulation of Semiconductor Processes and Devices - Implementation of ESD Protection in SOI Technology: A Simulation Study
Axelrad, V., Shibkov, A., Hayashi, H., Fukuda, K.Year:
2005
Language:
english
DOI:
10.1109/sispad.2005.201472
File:
PDF, 3.01 MB
english, 2005