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[IEEE Comput. Soc 2002 Design, Automation and Test in Europe Conference and Exhibition - Paris, France (4-8 March 2002)] Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition - Analog circuit sizing using adaptive worst-case parameter sets
Schwencker, R., Schenkel, F., Pronath, M., Graeb, H.Year:
2002
Language:
english
DOI:
10.1109/date.2002.998359
File:
PDF, 355 KB
english, 2002