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[IEEE 2006 IEEE international SOI - Niagara Falls, NY, USA (2006.10.2-2006.10.5)] 2006 IEEE international SOI Conferencee Proceedings - Effects of Temperature on Metal Gate FinFET Circuit Performance
Marshall, Andrew, Xiong, Weize, Cleavelin, C., Matthews, Ken, Konblinger, Gerhard, Pacha, Christian, Armin, Klaus, Schulz, Thomas, Schruefer, Klaus, Patruno, PaulYear:
2006
Language:
english
DOI:
10.1109/soi.2006.284488
File:
PDF, 2.17 MB
english, 2006