[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China (2007.10.8-2007.10.11)] 16th Asian Test Symposium (ATS 2007) - Fault Dictionary Based Scan Chain Failure Diagnosis
Guo, Ruifeng, Huang, Yu, Cheng, Wu-TungYear:
2007
Language:
english
DOI:
10.1109/ats.2007.43
File:
PDF, 202 KB
english, 2007