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[IEEE 2008 19th International Conference on Pattern Recognition (ICPR) - Tampa, FL, USA (2008.12.8-2008.12.11)] 2008 19th International Conference on Pattern Recognition - A novel validity measure for clusters of arbitrary shapes and densities
Yousri, Noha A., Kamel, Mohamed S., Ismail, Mohamed A.Year:
2008
Language:
english
DOI:
10.1109/icpr.2008.4761242
File:
PDF, 356 KB
english, 2008