A methodology to study lateral parasitic transistors in CMOS technologies
Flament, O., Chabrerie, C., Ferlet-Cavrois, V., Leray, J.L.Volume:
45
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.685211
Date:
June, 1998
File:
PDF, 544 KB
english, 1998