The reliability of embedded AI systems

IEEE Expert 1993 / 04 Vol. 8; Iss. 2

The reliability of embedded AI systems

Bastani, F.B., Chen, I.-R.
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Volume:
8
Language:
english
Journal:
IEEE Expert
DOI:
10.1109/64.207431
Date:
April, 1993
File:
PDF, 954 KB
english, 1993
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