[IEEE International Electron Devices Meeting. Technical Digest - Washington, DC, USA (2-5 Dec. 2001)] International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) - Novel ultra high density flash memory with a stacked-surrounding gate transistor (S-SGT) structured cell
Endoh, T., Kinoshita, K., Tanigami, T., Wada, Y., Sato, K., Yamada, K., Yokoyama, T., Takeuchi, N., Tanaka, K., Awaya, N., Sakiyama, K., Masuoka, F.Year:
2001
Language:
english
DOI:
10.1109/iedm.2001.979396
File:
PDF, 322 KB
english, 2001