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[IEEE 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2012.10.2-2012.10.4)] 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Application of S-graphs for modeling systems of metrological procurement and control
Palchun, Yu. A., Elistratova, I. B., Yakimova, I. V., Zemtsov, S. P., Kvitkova, I. G.Year:
2012
Language:
russian
DOI:
10.1109/apeie.2012.6628959
File:
PDF, 373 KB
russian, 2012