[IEEE 2012 18th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW 2012) - Taipei, Taiwan (2012.05.14-2012.05.16)] 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop - Low-IMD Two-Tone Signal Generation for ADC Testing
Kato, Keisuke, Abe, Fumitaka, Wakabayashi, Kazuyuki, Yamada, Takafumi, Kobayashi, Haruo, Kobayashi, Osamu, Niitsu, KiichiYear:
2012
Language:
english
DOI:
10.1109/ims3tw.2012.26
File:
PDF, 1.58 MB
english, 2012