[IEEE 2008 ROCS Workshop [Reliability of Compound Semiconductors Workshop] - Monterey, CA, USA (2008.10.12-2008.10.12)] 2008 ROCS Workshop [Reliability of Compound Semiconductors Workshop] - RF Arrhenius life testing of X-band GaN HEMITs
Mittereder, J., Binari, S., Via, G., Roussos, I, Caldwell, J., Calame, J.Year:
2008
Language:
english
DOI:
10.1109/rocs.2008.5483627
File:
PDF, 708 KB
english, 2008