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[IEEE 2010 28th VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2010.04.19-2010.04.22)] 2010 28th VLSI Test Symposium (VTS) - Selecting the most relevant structural Fmax for system Fmax correlation
Chen, Janine, Zeng, Jing, Wang, Li-C., Rearick, Jeff, Mateja, MichaelYear:
2010
Language:
english
DOI:
10.1109/vts.2010.5469604
File:
PDF, 878 KB
english, 2010