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[IEEE Proceedings of 2010 International Symposium on VLSI Technology, System and Application - Hsin Chu, Taiwan (2010.04.26-2010.04.28)] Proceedings of 2010 International Symposium on VLSI Technology, System and Application - Variation; key issue of the advanced CMOS & LSI's
Kamohara, Shiro, Nishida, Akio, Hiramoto, Toshiro, Mogami, ToruYear:
2010
Language:
english
DOI:
10.1109/vtsa.2010.5488922
File:
PDF, 775 KB
english, 2010