[IEEE 2008 3rd International Design and Test Workshop (IDT)...

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[IEEE 2008 3rd International Design and Test Workshop (IDT) - Monastir, Tunisia (2008.12.20-2008.12.22)] 2008 3rd International Design and Test Workshop - Systematic design of CCI(II)(III)s by combining UGCs

Tlelo-Cuautle, E., Moro-Frias, D., Fakhfakh, M.
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Year:
2008
Language:
english
DOI:
10.1109/idt.2008.4802528
File:
PDF, 129 KB
english, 2008
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