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[IEEE 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Mumbai, India (2010.12.14-2010.12.16)] 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Reliability and Life Prediction for electronic connectors for control applications
Varde, P.V., Agarwal, M., Marathe, P.P., Mohapatra, U., Sharma, R.C., Naikan, V.N.A.Year:
2010
Language:
english
DOI:
10.1109/icresh.2010.5779634
File:
PDF, 1.22 MB
english, 2010