[IEEE 13th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference. Advancing the Science and Technology of Semiconductor Manufacturing. ASMC 2002 - Boston, MA, USA (30 April-2 May 2002)] 13th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference. Advancing the Science and Technology of Semiconductor Manufacturing. ASMC 2002 (Cat. No.02CH37259) - An approach for improving yield with intentional defects
Engbrecht, A., Jarvis, R., Warrick, A.Year:
2002
Language:
english
DOI:
10.1109/asmc.2002.1001619
File:
PDF, 522 KB
english, 2002