Limitations on the extraction of loss tangent from...

IEEE Transactions on Advanced Packaging 2000 / Aug. Vol. 23; Iss. 3

Limitations on the extraction of loss tangent from submicron transmission line test structures

Friar, R.J., Neikirk, D.P.
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Volume:
23
Language:
english
Journal:
IEEE Transactions on Advanced Packaging
DOI:
10.1109/6040.861552
Date:
January, 2000
File:
PDF, 105 KB
english, 2000
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