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[IEEE Comput. Soc. Press International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Washington, DC, USA (12-14 Sept. 1988)] International Test Conference 1988 Proceeding@m_New Frontiers in Testing - New testing equipment for SMT PC boards
Balme, L., Mignotte, A., Monari, J.-Y., Pondaven, P., Vaucher, C.Year:
1988
Language:
english
DOI:
10.1109/test.1988.207827
File:
PDF, 633 KB
english, 1988