[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Fast aging degradation rate prediction during production test
Wang, Xiaoxiao, Winemberg, LeRoy, Haggag, Amr, Chayachinda, Joe, Saluja, Amandeep, Tehranipoor, MohammadYear:
2014
Language:
english
DOI:
10.1109/irps.2014.6861107
File:
PDF, 538 KB
english, 2014