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[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Fast aging degradation rate prediction during production test

Wang, Xiaoxiao, Winemberg, LeRoy, Haggag, Amr, Chayachinda, Joe, Saluja, Amandeep, Tehranipoor, Mohammad
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Year:
2014
Language:
english
DOI:
10.1109/irps.2014.6861107
File:
PDF, 538 KB
english, 2014
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