Reconciling 3-D Mixed-Mode Simulations and Measured Single-Event Transients in SiGe HBTs
Turowski, Marek, Pellish, Jonathan A., Moen, Kurt A., Raman, Ashok, Cressler, John D., Reed, Robert A., Niu, GuofuVolume:
57
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2010.2076835
Date:
December, 2010
File:
PDF, 1.37 MB
english, 2010