[IEEE 2013 18th IEEE European Test Symposium (ETS) - Avignon, France (2013.05.27-2013.05.30)] 2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Test generation for circuits with embedded memories using SMT
Prabhu, Sarvesh, Hsiao, Michael S., Lingappan, Loganathan, Gangaram, VijayYear:
2013
Language:
english
DOI:
10.1109/ets.2013.6569390
File:
PDF, 94 KB
english, 2013