Assessment of NBTI in Presence of Self-Heating in High- $k$...

IEEE Electron Device Letters 2012 / 11 Vol. 33; Iss. 11

Assessment of NBTI in Presence of Self-Heating in High- $k$ SOI FinFETs

Monga, Udit, Khandelwal, Sourabh, Aghassi, Jasmin, Sedlmeir, Josef, Fjeldly, Tor A.
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Volume:
33
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2012.2213572
Date:
November, 2012
File:
PDF, 268 KB
english, 2012
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