[IEEE 2006 IEEE 8th International Conference on Properties...

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[IEEE 2006 IEEE 8th International Conference on Properties and applications of Dielectric Materials - Bali, Indonesia (2006.06.26-2006.06.30)] 2006 IEEE 8th International Conference on Properties and applications of Dielectric Materials - Discussion on Resistivity Testing Method of Semi-conducting screen in Power Cables

Zhu, Yonghua, Wu, Changshun, Yin, Yi, Li, Zhe
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Year:
2006
Language:
english
DOI:
10.1109/icpadm.2006.284192
File:
PDF, 4.31 MB
english, 2006
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