Generation-recombination noise in pseudomorphic...

IEEE Sensors Journal 2005 / 10 Vol. 5; Iss. 5

Generation-recombination noise in pseudomorphic Modulation-doped Al/sub 0.2/Ga/sub 0.8/As/In/sub 0.1/Ga/sub 0.9/As/GaAs micro-Hall devices

Kunets, V.P., Pomraenke, R., Dobbert, J., Kissel, H., Muller, U., Kostial, H., Wiebicke, E., Tarasov, G.G., Mazur, Y.I., Masselink, W.T.
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Volume:
5
Language:
english
Journal:
IEEE Sensors Journal
DOI:
10.1109/jsen.2004.841436
Date:
October, 2005
File:
PDF, 611 KB
english, 2005
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