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[IEEE 2nd IEEE International Conference on Industrial Informatics, 2004. INDIN '04. 2004 - Berlin, Germany (24-26 June 2004)] 2nd IEEE International Conference on Industrial Informatics, 2004. INDIN '04. 2004 - Automatic inspection of optically digitized data with polyworks
Duwe, H.-P.Year:
2004
Language:
english
DOI:
10.1109/indin.2004.1417378
File:
PDF, 73 KB
english, 2004