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[IEEE 2009 International Semiconductor Conference (CAS 2009) - Sinaia, Romania (2009.10.12-2009.10.14)] 2009 International Semiconductor Conference - Characterisation of dielectric LTCC tapes using the capacitance method
Blaz, N., Radosavljevic, G., Zivanov, Lj., Smetana, W.Year:
2009
Language:
english
DOI:
10.1109/smicnd.2009.5336682
File:
PDF, 890 KB
english, 2009