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[IEEE 2006 15th Asian Test Symposium - Fukuoka, Japan (2006.11.20-2006.11.20)] 2006 15th Asian Test Symposium - Zero Cost Test Point Insertion Technique to Reduce Test Set Size and Test Generation Time for Structured ASICs
Sethuram, Rajamani, Wang, Seongmoon, Chakradhar, Srimat, Bushnell, MichaelYear:
2006
Language:
english
DOI:
10.1109/ats.2006.260953
File:
PDF, 309 KB
english, 2006