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Nonlinear Near-Field Microwave Microscope for RF Defect Localization in Superconductors
Tai, Tamin, Xi, X. X., Zhuang, C. G., Mircea, Dragos I., Anlage, Steven M.Volume:
21
Language:
english
Journal:
IEEE Transactions on Applied Superconductivity
DOI:
10.1109/tasc.2010.2096531
Date:
June, 2011
File:
PDF, 410 KB
english, 2011