[IEEE 2010 2nd International Conference on Reliability,...

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[IEEE 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Mumbai, India (2010.12.14-2010.12.16)] 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Modeling of timeliness hazard rate for networked real-time systems

Kumar, Manoj, Mahapatra, U., Srivastava, G.P., Verma, A.K.
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Year:
2010
Language:
english
DOI:
10.1109/icresh.2010.5779594
File:
PDF, 875 KB
english, 2010
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