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[IEEE 2006 European Microwave Integrated Circuits Conference - Manchester, UK (2006.09.10-2006.09.13)] 2006 European Microwave Integrated Circuits Conference - New drain current model for MESFET/HEMT devices based on pulsed measurements

Rafael-Valdivia, Guillermo, Brady, Ronan, Brazil, Thomas
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Year:
2006
Language:
english
DOI:
10.1109/emicc.2006.282809
File:
PDF, 3.04 MB
english, 2006
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