Surface and interface roughness estimations by X-ray...

Surface and Interface Analysis 2014 / 12 Vol. 46; Iss. 12-13

Surface and interface roughness estimations by X-ray reflectivity and RBS measurements

Fujii, Y., Nakajima, K., Suzuki, M., Kimura, K.
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Volume:
46
Language:
english
Journal:
Surface and Interface Analysis
DOI:
10.1002/sia.5644
Date:
December, 2014
File:
PDF, 1.43 MB
english, 2014
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