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[IEEE 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - Hong Kong, China (2008.01.23-2008.01.25)] 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices
Ooi, Melanie Po-Leen, Kuang, Ye Chow, Chan, Chris, Demidenko, SergeYear:
2008
Language:
english
DOI:
10.1109/delta.2008.105
File:
PDF, 442 KB
english, 2008