Robust fault diagnosis for large-scale analog circuits with...

IEEE Transactions on Circuits and Systems I Fundamental Theory and Applications 1997 / 3 Vol. 44; Iss. 3

Robust fault diagnosis for large-scale analog circuits with measurement noises

Hsin-Teng Sheu,, Yuen-Haw Chang,
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Volume:
44
Language:
english
Journal:
IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications
DOI:
10.1109/81.557362
Date:
March, 1997
File:
PDF, 494 KB
english, 1997
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