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[IEEE 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Marina Bay Sands, Singapore (2014.6.30-2014.7.4)] Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - The observation of mobile ion of 40nm node by Triangular Voltage Sweep
Huang, Clement, Liang, James W., Juan, Alex, Su, K. C.Year:
2014
DOI:
10.1109/ipfa.2014.6898164
File:
PDF, 216 KB
2014