[IEEE 2010 IEEE International Symposium on Defect and Fault...

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[IEEE 2010 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Kyoto, Japan (2010.10.6-2010.10.8)] 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems - Hybrid Built-In Self-Test Architecture for Multi-port Static RAMs

Yu, Lizhen, Hung, Jeffrey, Sheu, Boryau, Huynh, Bill, Nguyen, Loc, Wu, Shianling, Wang, Laung-Terng, Wen, Xiaoqing
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Year:
2010
Language:
english
DOI:
10.1109/dft.2010.47
File:
PDF, 340 KB
english, 2010
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