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[IEEE 2009 IEEE International Workshop on Genomic Signal Processing and Statistics (GENSIPS) - Minneapolis, MN, USA (2009.05.17-2009.05.21)] 2009 IEEE International Workshop on Genomic Signal Processing and Statistics - A sensitivity analysis of microarray feature selection and classification under measurement noise
Sontrop, Herman, van den Ham, Rene, Moerland, Perry, Reinders, Marcel, Verhaegh, WimYear:
2009
Language:
english
DOI:
10.1109/gensips.2009.5174352
File:
PDF, 1.71 MB
english, 2009