[IEEE 2007 IEEE International Conference on Software Maintenance - Paris, France (2007.10.2-2007.10.5)] 2007 IEEE International Conference on Software Maintenance - Fault Detection Probability Analysis for Coverage-Based Test Suite Reduction
McMaster, Scott, Memon, AtifYear:
2007
Language:
english
DOI:
10.1109/icsm.2007.4362646
File:
PDF, 917 KB
english, 2007