![](/img/cover-not-exists.png)
The effect of change of voltage acceleration on temperature activation of oxide breakdown for ultrathin oxides
Wu, E.Y., McKenna, J.M., Lai, W., Nowak, E., Vayshenker, A.Volume:
22
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/55.974592
Date:
December, 2001
File:
PDF, 70 KB
english, 2001