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[IEEE Third Annual IEEE on ASIC Seminar and Exhibit - Rochester, NY, USA (17-21 Sept. 1990)] Third Annual IEEE Proceedings on ASIC Seminar and Exhibit - Direct access test scheme-implementation and verification in embedded ASIC designs
Immaneni, V., Puffer, D., Raman, S.Year:
1990
Language:
english
DOI:
10.1109/asic.1990.186177
File:
PDF, 360 KB
english, 1990