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[IEEE Management Symposium (SEMI-THERM) - San Jose, CA, USA (2011.03.20-2011.03.24)] 2011 27th Annual IEEE Semiconductor Thermal Measurement and Management Symposium - Angle-of-attack investigation of pin-fin arrays in nonuniform heat-removal cavities for interlayer cooled chip stacks
Brunschwiler, T., Paredes, S., Drechsler, U., Michel, B.Year:
2011
Language:
english
DOI:
10.1109/stherm.2011.5767188
File:
PDF, 1.77 MB
english, 2011