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[IEEE 2012 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2012.10.14-2012.10.18)] 2012 IEEE International Integrated Reliability Workshop Final Report - Impact and measurement of short term threshold instabilities in MOSFETs of analog circuits
Rott, K., Schmitt-Landsiedel, D., Reisinger, H., Rott, G., Georgakos, G., Schluender, C., Aresu, S., Gustin, W., Grasser, T.Year:
2012
Language:
english
DOI:
10.1109/iirw.2012.6468913
File:
PDF, 691 KB
english, 2012