[IEEE ICMTS 2002. 2002 International Conference on Microelectronic Test Structures - Cork, Ireland (8-11 April 2002)] Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. - BSIM4.1 DC parameter extraction on 50 nm n-pMOSFETs
Souil, D., Guegan, G., Bertrand, G., Faynot, O., Deleonibs, S., Ghibaudo, G.Year:
2002
Language:
english
DOI:
10.1109/icmts.2002.1193182
File:
PDF, 254 KB
english, 2002