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[IEEE 2007 IEEE Radio Frequency Integrated Circuits Symposium - Honolulu, HI, USA (2007.06.3-2007.06.5)] 2007 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - A New Noise Parameter Model of Short-Channel MOSFETs
Jeon, Jongwook, Song, Ickhyun, Kang, In Man, Yun, Yeonam, Park, Byung-Gook, Lee, Jong Duk, Shin, HyungcheolYear:
2007
Language:
english
DOI:
10.1109/rfic.2007.380964
File:
PDF, 564 KB
english, 2007